Reflectance difference spectroscopy characterization of AlxGa1 xN-compound layers

Autor:	U. Rossow, Volker Cimalla, Oliver Ambacher, N.V. Edwards, David E. Aspnes, Martin Stutzmann, M. Bremser, Juergen A. Schaefer, Robert F. Davis
Předmět:	Materials science business.industry Analytical chemistry Optoelectronics Reflectance difference spectroscopy Condensed Matter Physics business Electronic Optical and Magnetic Materials Characterization (materials science)
Zdroj:	Scopus-Elsevier
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_dedup___::6c467a60525f6fa7a4d517982226dabe http://www.scopus.com/inward/record.url?eid=2-s2.0-0033229651&partnerID=MN8TOARS Zobrazit plný text záznamu