Scattering from high efficiency diffraction gratings
| Autor: | M. L. Minden, Gilmore J. Dunning |
|---|---|
| Rok vydání: | 2010 |
| Předmět: |
Diffraction
Materials science Plane of incidence business.industry Scattering Materials Science (miscellaneous) Holography Physics::Optics Diffraction efficiency Industrial and Manufacturing Engineering law.invention Ion Optics law Etching (microfabrication) Optoelectronics Business and International Management business Diffraction grating |
| Zdroj: | Applied optics. 19(14) |
| ISSN: | 1559-128X |
| Popis: | This paper has characterized and measured scatter from high efficiency and reflective diffraction gratings. Three major types of scatter are identified: (1) random, which occurs over 27pi sr; (2) band or ghost scatter, which occurs in the plane of incidence; and (3) structured scatter, which is a symmetrical pattern repeated about each order. Measurements were taken at 10.6 Am on gratings made by ruling, ion etching, holography, or a combination of these techniques. We found that the characteristic scatter from these high efficiency gratings depends strongly on the way the gratings are fabricated. |
| Databáze: | OpenAIRE |
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