Analysis of current-voltage characteristics for Langmuir probes immersed in an ion beam
| Autor: | Emanuele Sartori, V. Candeloro, Gianluigi Serianni |
|---|---|
| Rok vydání: | 2020 |
| Předmět: |
010302 applied physics
Materials science Ion beam Plasma Electron 01 natural sciences Space charge Negative ions Ion bombardment Secondary emission 010305 fluids & plasmas Ion symbols.namesake Physics::Plasma Physics Beam plasma interactions Ion beams 0103 physical sciences symbols Physics::Accelerator Physics Langmuir probe Probes Atomic physics Instrumentation Beam (structure) |
| Zdroj: | Review of scientific instruments 91 (2020): 023504-1–023504-6. doi:10.1063/1.5128669 info:cnr-pdr/source/autori:Sartori E.; Candeloro V.; Serianni G./titolo:Analysis of current-voltage characteristics for Langmuir probes immersed in an ion beam/doi:10.1063%2F1.5128669/rivista:Review of scientific instruments/anno:2020/pagina_da:023504-1/pagina_a:023504-6/intervallo_pagine:023504-1–023504-6/volume:91 |
| ISSN: | 1089-7623 |
| DOI: | 10.1063/1.5128669 |
| Popis: | Movable electrical probes were used to diagnose the beam flux profile and potential of ion beams since the early 1960s. Experimental measurements of beam plasmas can provide essential data related to the space charge neutralization, but the current–voltage characteristics obtained from such electrical probes are dominated by beam ion impact and ion-induced secondary emission. In this work, we present an analysis of the Langmuir characteristics obtained in a negative ion beam. We identify and discuss separately the contributions to the collected current given by secondary plasma ions and electrons, stripped electrons, beam ions, and ion-induced secondary electron emission. We present the beam plasma parameters obtained at different beam energies in NIO1.Movable electrical probes were used to diagnose the beam flux profile and potential of ion beams since the early 1960s. Experimental measurements of beam plasmas can provide essential data related to the space charge neutralization, but the current–voltage characteristics obtained from such electrical probes are dominated by beam ion impact and ion-induced secondary emission. In this work, we present an analysis of the Langmuir characteristics obtained in a negative ion beam. We identify and discuss separately the contributions to the collected current given by secondary plasma ions and electrons, stripped electrons, beam ions, and ion-induced secondary electron emission. We present the beam plasma parameters obtained at different beam energies in NIO1. |
| Databáze: | OpenAIRE |
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