Elemental mapping of nanoscale structures in the aberration-corrected analytical electron microscope
| Autor: | Graham J. Hutchings, Wei-xian Zhang, Albert Frederick Carley, Xiabao Li, Andrew A. Herzing, I. M. Anderson, Christopher J. Kiely, Jennifer K. Edwards |
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| Jazyk: | angličtina |
| Rok vydání: | 2008 |
| Předmět: |
Conventional transmission electron microscope
Materials science Atomic de Broglie microscope business.industry Electron Characterization (materials science) law.invention law Scanning transmission electron microscopy Optoelectronics Electron microscope Electron beam-induced deposition business Instrumentation Environmental scanning electron microscope |
| ISSN: | 1435-8115 |
| Popis: | Modern analytical electron microscopes (AEM’s) are powerful instruments for the structural and chemical characterization of materials at the nanoscale, and recent developments promise to further enhance their capabilities. Spherical aberration-correctors have made possible the formation of ultrafine electron probes with a total current that is comparable to that in the uncorrected instrument [1], making the aberration-corrected AEM ideally suited for microanalysis at the nanoscale. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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