A Ti/Pt/Co Multilayer Stack For Transfer Function Based Magnetic Force Microscopy Calibrations
| Autor: | İlker Öztoprak, Baha Sakar, Felipe Garcia-Sanchez, Hans Werner Schumacher, Osman Ozturk, Alexander Fernández Scarioni, Sibylle Sievers |
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| Rok vydání: | 2021 |
| Předmět: |
Point spread function
Materials science FOS: Physical sciences 02 engineering and technology 01 natural sciences Magnetization Optics Stack (abstract data type) 0103 physical sciences Mesoscale and Nanoscale Physics (cond-mat.mes-hall) Materials Chemistry Calibration acoustics magnetic multilayers QD1-999 Micromagnetics 010302 applied physics magnetic force microscopy calibration reference samples micromagnetism metrology for magnetism Condensed Matter - Mesoscale and Nanoscale Physics business.industry Demagnetizing field Astrophysics::Instrumentation and Methods for Astrophysics 021001 nanoscience & nanotechnology Electronic Optical and Magnetic Materials Chemistry Chemistry (miscellaneous) Deconvolution Magnetic force microscope 0210 nano-technology business |
| Zdroj: | Magnetochemistry, Vol 7, Iss 78, p 78 (2021) Magnetochemistry; Volume 7; Issue 6; Pages: 78 |
| Popis: | Magnetic force microscopy is a widespread technique for imaging magnetic structures with a resolution of some 10 nanometers. MFM can be calibrated to obtain quantitative spatially resolved magnetization data in units of A/m by determining the calibrated point spread function of the instrument, its instrument calibration function (ICF), from a measurement of a well-known reference sample. Beyond quantifying the MFM data, a deconvolution of the MFM image data with the ICF also corrects the smearing caused by the finite width of the MFM tip stray field distribution. However, the quality of the calibration depends critically on the calculability of the magnetization distribution of the reference sample. Here, we discuss a Ti/Pt/Co multilayer stack that shows a stripe domain pattern as a suitable reference material. A precise control of the fabrication process, combined with a characterization of the sample micromagnetic parameters, allows reliable calculation of the sample's magnetic stray field, proven by a very good agreement between micromagnetic simulations and qMFM measurements. A calibrated qMFM measurement using the Ti/Pt/Co stack as a reference sample is shown and validated, and the application area for quantitative MFM measurements calibrated with the Ti/Pt/Co stack is discussed 24 page 12 Picture |
| Databáze: | OpenAIRE |
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