Refraction index sensor based on phase resonances in a subwavelength structure with double period
| Autor: | Diana C. Skigin, M. Lester |
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| Jazyk: | angličtina |
| Rok vydání: | 2016 |
| Předmět: |
Materials Science (miscellaneous)
Ciencias Físicas Physics::Optics X-ray optics sensors 01 natural sciences Industrial and Manufacturing Engineering law.invention 010309 optics Optics law Phase (matter) 0103 physical sciences Total external reflection Business and International Management 010306 general physics double period gratings Physics business.industry Refraction subwavelength structures Astronomía Wavelength business Refractive index Waveguide Fabry–Pérot interferometer CIENCIAS NATURALES Y EXACTAS |
| Popis: | In this paper, we numerically demonstrate a refraction index sensor based on phase resonance excitation in a subwavelength-slit structure with a double period. The sensor consists of a metal layer with subwavelength slots arranged in a bi-periodic form, separated from a high refraction index medium. Between the metallic structure and the incident medium, a dielectric waveguide is formed whose refraction index is going to be determined. Variations in the refraction index of the waveguide are detected as shifts in the peaks of transmitted intensity originated by resonant modes supported by the compound metallic structure. At normal incidence, the spectral position of these resonant peaks exhibits a linear or a quadratic dependence with the refraction index, which permits us to obtain theunknown refraction index value with a high precision for a wide range of wavelengths. Since the operating principle of the sensor is due to the morphological resonances of the slits? structure, this device can be scaled to operate in different wavelength ranges while keeping similar characteristics. Fil: Skigin, Diana Carina. Universidad de Buenos Aires; Argentina. Consejo Nacional de Investigaciones Científicas y Técnicas. Oficina de Coordinación Administrativa Ciudad Universitaria. Instituto de Física de Buenos Aires. Universidad de Buenos Aires. Facultad de Ciencias Exactas y Naturales. Instituto de Física de Buenos Aires; Argentina Fil: Lester, Marcelo Fabian. Centro de Investigaciones En Fisica E Ingenieria del Centro de la Provincia de Buenos Aires; Argentina |
| Databáze: | OpenAIRE |
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