CMOS integrated system for magnetic field monitoring and gradient measurement in MRI environment
| Autor: | Vincent Frick, Luc Hebrard, Joris Pascal, Jacques Felblinger, J.P. Blondé |
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| Přispěvatelé: | Jung, Marie-Anne, Institut d'Electronique du Solide et des Systèmes (InESS), Université Louis Pasteur - Strasbourg I-Centre National de la Recherche Scientifique (CNRS) |
| Jazyk: | angličtina |
| Rok vydání: | 2007 |
| Předmět: |
Engineering
business.industry 020208 electrical & electronic engineering Electrical engineering 020206 networking & telecommunications 02 engineering and technology Pulse (physics) Magnetic field CMOS 0202 electrical engineering electronic engineering information engineering Electronic engineering Static field Electronics business ComputingMilieux_MISCELLANEOUS |
| Zdroj: | 5th IEEE International NEWCAS Conference (NEWCAS'07) 5th IEEE International NEWCAS Conference (NEWCAS'07), Aug 2007, Montréal, Canada. Proc. pp. 69-72 |
| Popis: | This paper reports on a standard CMOS integrated system for monitoring the magnetic fields in MRI environments. The sub-micron technology circuit features three horizontal hall devices and their associated electronics that form instrumental chains. Two of them are dedicated to millitesla range magnetic pulse and gradient measurement whereas the third one is for monitoring the strong static field of the MRI setup. The 0.35 mum technology prototype performs 130 muT gradient measurement with 20 muT resolution and can also map static fields as high as 1.5T. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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