Effect of Annealing Atmosphere on the Diode Behaviour of ZnO/Si Heterojunction

Autor: Syed Riaz un Nabi Jafri, Naveed ul Hassan Alvi, Zarreen Tajvar, Omer Nur, Qamar Ul Wahab, Sadia Muniza Faraz
Jazyk: angličtina
Rok vydání: 2021
Předmět:
Zdroj: Elektronika ir Elektrotechnika, Vol 27, Iss 4, Pp 49-54 (2021)
ISSN: 2029-5731
1392-1215
Popis: The effect of thermal annealing atmosphere on the electrical characteristics of Zinc oxide (ZnO) nanorods/p-Silicon (Si) diodes is investigated. ZnO nanorods are grown by low-temperature aqueous solution growth method and annealed in Nitrogen and Oxygen atmosphere. As-grown and annealed nanorods are studied by scanning electron microscopy (SEM) and photoluminescence (PL) spectroscopy. Electrical characteristics of ZnO/Si heterojunction diodes are studied by current-voltage (I-V) and capacitance-voltage (C-V) measurements at room temperature. Improvements in rectifying behaviour, ideality factor, carrier concentration, and series resistance are observed after annealing. The ideality factor of 4.4 for as-grown improved to 3.8 and for Nitrogen and Oxygen annealed improved to 3.5 nanorods diodes. The series resistances decreased from 1.6 to 1.8 times after annealing. An overall improved behaviour is observed for oxygen annealed heterojunction diodes. The study suggests that by controlling the ZnO nanorods annealing temperatures and atmospheres the electronic and optoelectronic properties of ZnO devices can be improved. Funding Agencies|Sultan Qaboos Oman IT chair office and Electronic Design Center at the NED University of Engineering and Technology
Databáze: OpenAIRE