Optical properties of porous silicon
| Autor: | V. Ya. Gaivoronskii, M. I. Strashnikova, V. Ya. Reznichenko, V. L. Voznyi |
|---|---|
| Rok vydání: | 2001 |
| Předmět: |
Amorphous silicon
Materials science Silicon Physics::Instrumentation and Detectors business.industry Nanocrystalline silicon Physics::Optics General Physics and Astronomy chemistry.chemical_element Dielectric Porous silicon Crystal Condensed Matter::Materials Science chemistry.chemical_compound Optics chemistry Dispersion (optics) Composite material business Refractive index |
| Zdroj: | Scopus-Elsevier |
| ISSN: | 1090-6509 1063-7761 |
| DOI: | 10.1134/1.1402736 |
| Popis: | We have measured the absorption spectra and the dispersion of refractive index for porous silicon samples with different porosities in the energy range 1.5–3.5 eV at room temperatures. The experimental data are compared with the dependences calculated by using Bruggeman’s theory for the dielectric constant of a multicomponent system composed of crystal silicon, SiO2, amorphous silicon, and voids (pores). The best agreement between the experimental and theoretical dependences is achieved for a significant percentage of SiO2 in the porous silicon samples. |
| Databáze: | OpenAIRE |
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