Electron-beam induced degradation in CdTe photovoltaics

Autor:	G. Dorer, Victor G. Karpov, D. Grecu, R. Harju
Rok vydání:	2000
Předmět:	Materials science business.industry Electron beam-induced current General Physics and Astronomy Electron Cadmium telluride photovoltaics Optics Semiconductor Photovoltaics Phenomenological model Physics::Accelerator Physics Optoelectronics Grain boundary Charge carrier business
Zdroj:	Scopus-Elsevier
ISSN:	1089-7550 0021-8979
DOI:	10.1063/1.1305857
Popis:	We used electron beam induced current (EBIC) to measure degradation of CdTe photovoltaic cells. We have observed that: (i) the EBIC signal shows a considerable, continuous degradation depending on the electron-beam current, scan area, energy, and sample treatment; (ii) the characteristic degradation time fluctuates between different spots on the same sample; and (iii) grain boundary regions are the most effective collectors of the electron-beam generated charge carriers. Our phenomenological model relates the observed degradation to defects caused by the electron-beam generated electrons and holes.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_dedup___::67fe1f9425fb4efbf281582b6cee6ef9 https://doi.org/10.1063/1.1305857 Zobrazit plný text záznamu