Fluctuation Scaling in Nano-Interconnects and its Application to Electromigration

Autor:	Beyne, Sofie, Beyne, Tim
Přispěvatelé:	Enz, Christian
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_dedup___::67573f79e141cd02503f66ca086f041b https://infoscience.epfl.ch/record/269229 Zobrazit plný text záznamu