Depletion-induced colloidal crystals at a wall characterised by small-angle X-ray diffraction
| Autor: | Xian, X., Pethukov, A.V., Snel, M.M.E., Dolbnya, I.P., Aarts, D.G.A.L., Vroege, G.J., Lekkerkerker, H.N.W., Colloïden en grenslagen, Grensvlakken, Kristal- en structuurchemie, Physical and Colloid Chemistry 1, Dep Scheikunde |
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| Přispěvatelé: | Colloïden en grenslagen, Grensvlakken, Kristal- en structuurchemie, Physical and Colloid Chemistry 1, Dep Scheikunde |
| Rok vydání: | 2003 |
| Předmět: |
chemistry.chemical_classification
Diffraction Physics::Optics Polymer Substrate (electronics) Flat glass Colloidal crystal General Biochemistry Genetics and Molecular Biology Condensed Matter::Soft Condensed Matter Crystallography Condensed Matter::Materials Science chemistry X-ray crystallography Crystallite Photonic crystal |
| Zdroj: | Journal of Applied Crystallography, 36, 597. International Union of Crystallography |
| ISSN: | 0021-8898 |
| Popis: | Silica photonic colloidal crystals on a flat glass substrate have been grown using the depletion attraction induced by nonadsorbing polymers. The dried samples have been characterised with high-resolution synchrotron small-angle X-ray diffraction and their surface topography has been studied by atomic force microscopy. The presence of long-range ordered crystals with a thickness as large as 90 planes is demonstrated. However, on some places the films are polycrystalline and contain disordered regions. |
| Databáze: | OpenAIRE |
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