Leveraging CPU Electromagnetic Emanations for Voltage Noise Characterization
| Autor: | Hadjilambrou, Zacharias, Das, Shidhartha, Antoniades, Marco A., Sazeides, Yiannakis |
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| Přispěvatelé: | Antoniades, Marco A. [0000-0002-9699-2387] |
| Rok vydání: | 2018 |
| Předmět: |
010302 applied physics
Spectrum analyzer Computer science Resonance High voltage 02 engineering and technology 01 natural sciences 020202 computer hardware & architecture Noise Amplitude Hardware_GENERAL 0103 physical sciences 0202 electrical engineering electronic engineering information engineering Electronic engineering Leverage (statistics) Antenna (radio) Voltage |
| Zdroj: | MICRO 2018 51st Annual IEEE/ACM International Symposium on Microarchitecture (MICRO) |
| DOI: | 10.1109/micro.2018.00053 |
| Popis: | Worst-case dI/dt voltage noise is typically characterized post-silicon using direct voltage measurements through either on-package measurement points or on-chip dedicated circuitry. These approaches consume expensive pad resources or suffer from design-time and run-time overheads. This work proposes an alternative non-intrusive, zero-overhead approach for post-silicon dI/dt voltage noise generation based on sensing CPU electromagnetic emanations using an antenna and a spectrum analyzer. The approach is based on the observation that high amplitude electromagnetic emanations are correlated with high voltage noise. We leverage this observation to automatically generate voltage noise (dI/dt) stress tests with a genetic-algorithm that is driven by electromagnetic signal amplitude and to obtain the first-order resonance-frequency of the Power-Delivery LC-tank network. The generality of the approach is established by successfully applying it to three different CPUs: two ARM multi-core mobile CPU clusters hosted on a big.LITTLE configuration and an ×86-64 AMD desktop CPU. The efficacy of the proposed methodology is validated through VMIN and direct voltage noise measurements. 573 585 |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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