Double moiré structured illumination microscopy with high-index materials
| Autor: | Guy Bartal, Bergin Gjonaj, Doron Shterman, Yacob Yochai Blau |
|---|---|
| Rok vydání: | 2016 |
| Předmět: |
Physics
Total internal reflection business.industry Physics::Optics 02 engineering and technology Dielectric Moiré pattern 021001 nanoscience & nanotechnology 01 natural sciences Atomic and Molecular Physics and Optics 010309 optics Sine wave Optics 0103 physical sciences Köhler illumination Light beam Spatial frequency 0210 nano-technology business Refractive index |
| Zdroj: | Optics letters. 41(15) |
| ISSN: | 1539-4794 |
| Popis: | A system comprising: a dielectric configured to: a) create a bi-periodic interference pattern of two standing sinusoidal waves on illumination by two pairs of counter-propagating light beams at different incident angles, wherein the incident angles are selected in accordance with the index of refraction of the dielectric to i) to determine the spatial frequency of each counter-propagating light wave pair, and ii) cause total internal reflection, and b) generate, from the bi-periodic interference pattern, an evanescent bi-periodic standing sinusoidal wave; a light source configured to illuminate the dielectric with the two pairs of counter-propagating sinusoidal light waves at the selected incident angles and thereby illuminate a fluorescing object positioned at the surface of the dielectric with the generated bi-periodic evanescent standing sinusoidal wave; and one or more delay lines configured to independently modify the initial phase of each counter-propagating light wave pair. |
| Databáze: | OpenAIRE |
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