Optical properties of SrxBa1−xNb2O6 nanoscale films (x = 0.5 and 0.61) grown by RF-cathode sputtering in an oxygen atmosphere
Autor: | L. I. Kiseleva, N. V. Korchikova, S. V. Kara-Murza, A. V. Pavlenko, K. M. Zhidel, Yu. V. Tekhtelev |
---|---|
Rok vydání: | 2021 |
Předmět: |
QC501-721
Nanostructure Materials science Condensed Matter Physics Oxygen atmosphere Electronic Optical and Magnetic Materials thin films Electricity Chemical engineering Ellipsometry optical parameters Phase composition Ceramics and Composites Char Cathode sputtering Electrical and Electronic Engineering Thin film strontium–barium niobates Nanoscopic scale ellipsometry |
Zdroj: | Journal of Advanced Dielectrics, Vol 11, Iss 5, Pp 2160014-1-2160014-6 (2021) |
ISSN: | 2010-1368 2010-135X |
Popis: | The research findings of the phase composition, nanostructure and optical properties of strontium–barium niobate thin films are discussed. [Formula: see text]Ba[Formula: see text]Nb2O6 nanosized films ([Formula: see text] = 0.5 and 0.61) were characterized by XRD, SEM and AFM studies. Reflective multi-angle ellipsometry and spectrophotometry were used to determine the optical parameters (refractive index, its dispersion, and thickness of the damaged surface layer) of thin films. It was shown that SBN-50 and SBN-61 thin films were grown [Formula: see text]-oriented on Al2O3 (0001) and heteroepitaxial on MgO (001) substrates. The increase of refractive index, approaching its maximum value in the bulk material for a given composition as the film thickness increases, is observed. |
Databáze: | OpenAIRE |
Externí odkaz: |