Layer-doubling method in ADF-STEM image simulation
| Autor: | Kazuo Furuya, Yumio Toda, Kazutaka Mitsuishi, Masaki Takeguchi |
|---|---|
| Rok vydání: | 2003 |
| Předmět: |
Elastic scattering
Chemistry business.industry Physics::Optics Microstructure Dark field microscopy Atomic and Molecular Physics and Optics Electronic Optical and Magnetic Materials Image (mathematics) Optics Electron diffraction Scanning transmission electron microscopy Slab business Instrumentation Layer (electronics) |
| Zdroj: | Ultramicroscopy. 96:323-333 |
| ISSN: | 0304-3991 |
| DOI: | 10.1016/s0304-3991(03)00097-4 |
| Popis: | A layer-doubling method developed in LEED calculation is applied to the ADF-STEM image simulation. This approach makes it possible to simulate image intensities of systems having a repeated slab structure, such as embedded precipitates or defects, with a much higher efficiency because it does not require the diagonalization of repeated slabs. As a simple example of this method, channeling effects are calculated for a system with embedded crystalline displaced slabs for various different slab thicknesses. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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