The thickness of native oxides on aluminum alloys and single crystals
| Autor: | Franceso Carlà, Jonas Weissenrieder, Mikhail Shipilin, Jan-Olov Nilsson, Mats Göthelid, Jonas Evertsson, Lisa Rullik, Nikolay A. Vinogradov, Markus Soldemo, Fan Zhang, Sareh Ahmadi, Jinshan Pan, Anders Mikkelsen, Lindsay R. Merte, Florian Bertram, Edvin Lundgren |
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| Jazyk: | angličtina |
| Rok vydání: | 2015 |
| Předmět: |
Solid-state chemistry
Materials science Analytical chemistry Oxide technology industry and agriculture General Physics and Astronomy chemistry.chemical_element Equivalent oxide thickness Surfaces and Interfaces General Chemistry Condensed Matter Physics Nitrogen Surfaces Coatings and Films Dielectric spectroscopy X-ray reflectivity chemistry.chemical_compound X-ray photoelectron spectroscopy chemistry Aluminium ddc:670 |
| Zdroj: | Applied surface science 349, 826-832 (2015). doi:10.1016/j.apsusc.2015.05.043 |
| DOI: | 10.1016/j.apsusc.2015.05.043 |
| Popis: | We present results from measurements of the native oxide film thickness on four different industrial aluminum alloys and three different aluminum single crystals. The thicknesses were determined using X-ray reflectivity, X-ray photoelectron spectroscopy, and electrochemical impedance spectroscopy. In addition, atomic force microscopy was used for micro-structural studies of the oxide surfaces. The reflectivity measurements were performed in ultra-high vacuum, vacuum, ambient, nitrogen and liquid water conditions. The results obtained using X-ray reflectivity and X-ray photoelectron spectroscopy demonstrate good agreement. However, the oxide thicknesses determined from the electrochemical impedance spectroscopy show a larger discrepancy from the above two methods. In the present contribution the reasons for this discrepancy are discussed. We also address the effect of the substrate type and the presence of water on the resultant oxide thickness. |
| Databáze: | OpenAIRE |
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