| Autor: |
G. Ranganathan, K.L. Pey, S.L. Phoa, C. Nemirow, N. Leslie, V.K. Ravikumar |
| Rok vydání: |
2017 |
| Předmět: |
|
| Zdroj: |
Scopus-Elsevier |
| ISSN: |
0890-1740 |
| DOI: |
10.31399/asm.cp.istfa2017p0221 |
| Popis: |
Laser voltage imaging (LVI) and its derivatives are established techniques for isolating broken scan/JTAG chains which work on periodic signals, but are ineffective when debugging aperiodic signals. Laser voltage probing (LVP) works on one transistor at a time which makes it slow for certain debug. Laser voltage tracing (LVT), presented recently, has opportunity to perform an area investigation of aperiodic signals. This paper presents a few applications of this technique to fault isolation (FI). |
| Databáze: |
OpenAIRE |
| Externí odkaz: |
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