Design of Industrial Standards for the Calibration of Optical Microscopes
| Autor: | Cecilia Gómez Pérez, Alberto Mínguez Martínez, Laura Carcedo Cerezo, Jesús de Vicente y Oliva, David Canteli Pérez-Caballero |
|---|---|
| Rok vydání: | 2020 |
| Předmět: |
0209 industrial biotechnology
Traceability Computer science Mechanical engineering 02 engineering and technology Surface finish lcsh:Technology Field (computer science) Article surface texture 020901 industrial engineering & automation Calibration General Materials Science Focus variation lcsh:Microscopy lcsh:QC120-168.85 lcsh:QH201-278.5 lcsh:T standard 021001 nanoscience & nanotechnology calibration Characterization (materials science) Metrology metrology traceability lcsh:TA1-2040 Measuring instrument microscopy lcsh:Descriptive and experimental mechanics lcsh:Electrical engineering. Electronics. Nuclear engineering 0210 nano-technology lcsh:Engineering (General). Civil engineering (General) lcsh:TK1-9971 |
| Zdroj: | Materials Materials, Vol 14, Iss 29, p 29 (2021) Volume 14 Issue 1 |
| ISSN: | 1996-1944 |
| Popis: | One of the most important fields of study in material science is surface characterization. This topic is currently a field of growing interest as many functional properties depend on the surface texture. In this paper the authors, after a short a review of different methods for surface topography characterization and the determination of the traceability problems that arise in this type of measurements, propose four different designs of material standards that can be used to calibrate the most common optical measuring instruments used for these tasks, such as measuring microscopes, metallurgical microscopes, confocal microscopes, focus variation microscopes, etc. The authors consider that the use of this type of standards (or others similar to them) could provide a step forward in assuring metrological traceability for different metrological characteristics that enables a more precise measurement of surface features with optical measuring instruments. In addition, authors expect that this work could lay the groundwork for the development of custom standards with specialized features tuned to gain a better metrological control when measuring specific geometrical surface properties. |
| Databáze: | OpenAIRE |
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