Investigating the interaction of x-ray free electron laser radiation with grating structure

Autor: Mitsuru Nagasono, Jérôme Gaudin, Nicola Coppola, Stefan Möller, Henry N. Chapman, Kai Tiedtke, Karel Saksl, R.A. Loch, Ryszard Sobierajski, Sven Toleikis, Harald Sinn, Vĕra Hajkova, Ludĕk Vysin, Michael Störmer, Germano Galasso, Pavol Sovák, Jaromír Chalupský, Joachim Schulz, Jacek Krzywinski, Shafagh Dastjani Farahani, Marek Jurek, Marion Harmand, Libor Juha, Saša Bajt, Tomáš Burian, Thomas Tschentscher, C. Ozkan
Přispěvatelé: Faculty of Science and Technology, XUV Optics
Jazyk: angličtina
Rok vydání: 2012
Předmět:
Zdroj: Optics letters, 37(15), 3033-3035. The Optical Society
Gaudin, J.; Ozkan, C.; Chalupsky, J.; Bajt, S.; Burian, T.; Vysin, L.; CoppolaN.; Dastjani-Farahani, S.; Chapman, H.N.; Galasso, G.; Hajkova, V.; Harmand, M.; Juha, L.; Jurek, M.; Loch, R.A.; Moeller, S.; Nagasono, M.; Stoermer, M.; Sinn, H.; Saksl, K.; Sobierajski, R.; Schulz, J.; Sovak, P.; Toleikis, S.; Tiedtke, K.; Tschentscher, T.; Krzywinski, J.: Investigating the interaction of x-ray free electron laser radiation with grating structure. In: Optics Letters. Vol. 37 (2012) 15, 3033-3035. (DOI: 10.1364/OL.37.003033)
Optics Letters, 37, 3033-3035
Optics letters 37(15), 3033-3035 (2012). doi:10.1364/OL.37.003033
ResearcherID
ISSN: 0146-9592
Popis: The interaction of free electron laser pulses with grating structure is investigated using 4.6 +/- 0.1 nm radiation at the FLASH facility in Hamburg. For fluences above 63.7 +/- 8.7 mJ/cm(2), the interaction triggers a damage process starting at the edge of the grating structure as evidenced by optical and atomic force microscopy. Simulations based on solution of the Helmholtz equation demonstrate an enhancement of the electric field intensity distribution at the edge of the grating structure. A procedure is finally deduced to evaluate damage threshold. (C) 2012 Optical Society of America
Databáze: OpenAIRE