A design-for-testability expert system for silicon compilers

Autor:	van Riessen, R.P., Kerkhoff, Hans G., Janssen, J.M.J.
Rok vydání:	2002
Předmět:	Programming language Computer science Interface (computing) Design for testing computer.software_genre Expert system Computer architecture IR-16084 METIS-112968 Compiler Physical design Macro Engineering design process computer Testability
Zdroj:	VTS Proceedings 9th Anual IEEE VLSI Test Symposium, 10-15 STARTPAGE=10;ENDPAGE=15;TITLE=Proceedings 9th Anual IEEE VLSI Test Symposium
DOI:	10.1109/vtest.1991.208125
Popis:	This paper describes a design-for-testability expert system for the selection of the most appropriate test method for every macro within an IC. The interface with the system designer is user-friendly and together with an efficient search mechanism this expert system can be used as a framework for all types of macros. This tool will be used in a self-test compiler, which generates the layout of self-testable macros automatically. The self-test compiler can be part of a silicon compilation system and thus contribute to the integration of testability into the design process. >
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_dedup___::63a0363c1e571a239033ef38a63725d7 https://doi.org/10.1109/vtest.1991.208125 Zobrazit plný text záznamu