Combining total internal reflection sum frequency spectroscopy spectral imaging and confocal fluorescence microscopy
| Autor: | Mudalige S. Gunewardene, Michael Mason, Samuel T. Hess, Edward S. Allgeyer, David J. Neivandt, Sarah M. Sterling |
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| Rok vydání: | 2014 |
| Předmět: |
Fluorescence-lifetime imaging microscopy
medicine.medical_specialty Microscope Materials science Surface Properties Confocal law.invention Optics law Microscopy Electrochemistry Fluorescence microscope medicine General Materials Science Spectroscopy Total internal reflection Microscopy Confocal business.industry Rhodamines Surfaces and Interfaces Condensed Matter Physics Spectral imaging Calcium Fluoride Spectrometry Fluorescence Microscopy Fluorescence Ethanolamines Phosphatidylcholines Gold business |
| Zdroj: | Langmuir : the ACS journal of surfaces and colloids. 31(3) |
| ISSN: | 1520-5827 |
| Popis: | Understanding surface and interfacial lateral organization in material and biological systems is critical in nearly every field of science. The continued development of tools and techniques viable for elucidation of interfacial and surface information is therefore necessary to address new questions and further current investigations. Sum frequency spectroscopy (SFS) is a label-free, nonlinear optical technique with inherent surface specificity that can yield critical organizational information on interfacial species. Unfortunately, SFS provides no spatial information on a surface; small scale heterogeneities that may exist are averaged over the large areas typically probed. Over the past decade, this has begun to be addressed with the advent of SFS microscopy. Here we detail the construction and function of a total internal reflection (TIR) SFS spectral and confocal fluorescence imaging microscope directly amenable to surface investigations. This instrument combines, for the first time, sample scanning TIR-SFS imaging with confocal fluorescence microscopy. |
| Databáze: | OpenAIRE |
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