Portable Low-Cost Measurement Setup for 2D Imaging of Organic Semiconductors
| Autor: | Marzena Olszewska-Placha, Janusz Rudnicki, Przemyslaw Korpas, Olivier Douheret, Malgorzata Celuch, Ryszard Michnowski |
|---|---|
| Jazyk: | angličtina |
| Předmět: |
Organic electronics
Scanner Computer science business.industry Electrical engineering 020206 networking & telecommunications 02 engineering and technology Dielectric resonator 021001 nanoscience & nanotechnology Network analyzer (electrical) Signal Organic semiconductor Nondestructive testing 0202 electrical engineering electronic engineering information engineering 0210 nano-technology business Microwave |
| Zdroj: | 2020 IEEE/MTT-S International Microwave Symposium (IMS) |
| DOI: | 10.1109/ims30576.2020.9224053 |
| Popis: | A portable test-fixture for the imaging of discontinuities in novel materials, such as organic semiconductors, is designed, manufactured, and validated. A 10 GHz split-post dielectric resonator (SPDR) compliant with the IEC norm is used as a microwave probe. It is built into a custom-made 2D shift-shift scanner, providing non-destructive microwave-transparent support for the sample-under-test. Microwave signal generation and measurements are performed by a new dedicated scalar network analyzer, called Q-Meter. The setup is controlled by Windows application, which allows also connecting to professional VNAs. Verification of the portable scanner is provided with respect to stand-alone SPDR and laboratory VNA. It is then applied to a PEDOT sample of current interest in organic electronics. |
| Databáze: | OpenAIRE |
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