An Inter-Laboratory Study of Zn-Sn-Ti-O Thin Films using High-Throughput Experimental Methods
Autor: | Sara C. Barron, Feng Yi, Jason R. Hattrick-Simpers, Andriy Zakutayev, A. Gilad Kusne, Ichiro Takeuchi, Apurva Mehta, Zachary T. Trautt, Nam Nguyen, Caleb Phillips, John D. Perkins, Kamal Choudhary, Brian L. DeCost, Martin L. Green |
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Rok vydání: | 2019 |
Předmět: |
Orders of magnitude (temperature)
Band gap 010402 general chemistry 01 natural sciences Pulsed laser deposition Small Molecule Libraries Materials Testing Alloys Combinatorial Chemistry Techniques Thin film Sheet resistance Titanium Reproducibility 010405 organic chemistry Chemistry Lasers Oxides General Chemistry General Medicine Engineering physics 0104 chemical sciences High-Throughput Screening Assays Zinc Tin Physical vapor deposition NIST |
Zdroj: | ACS combinatorial science. 21(5) |
ISSN: | 2156-8944 |
Popis: | High-throughput experimental (HTE) techniques are an increasingly important way to accelerate the rate of materials research and development for many technological applications. However, there are very few publications on the reproducibility of the HTE results obtained across different laboratories for the same materials system, and on the associated sample and data exchange standards. Here, we report a comparative study of Zn-Sn-Ti-O thin films materials using high-throughput experimental methods at National Institute of Standards and Technology (NIST) and National Renewable Energy Laboratory (NREL). The thin film sample libraries were synthesized by combinatorial physical vapor deposition (cosputtering and pulsed laser deposition) and characterized by spatially resolved techniques for composition, structure, thickness, optical, and electrical properties. The results of this study indicate that all these measurement techniques performed at two different laboratories show excellent qualitative agreement. The quantitative similarities and differences vary by measurement type, with 95% confidence interval of 0.1-0.2 eV for the band gap, 24-29 nm for film thickness, and 0.08 to 0.37 orders of magnitude for sheet resistance. Overall, this work serves as a case study for the feasibility of a High-Throughput Experimental Materials Collaboratory (HTE-MC) by demonstrating the exchange of high-throughput sample libraries, workflows, and data. |
Databáze: | OpenAIRE |
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