Analysis of Metrological Provision Problems of a Test Stand for Testing Radio-Electronic Products for Resistance to Irradiation with High-Energy Heavy Ions
| Autor: | Andrey Butenko, K. V. Pavlov, V. I. Rogov, Timur Kulevoy, V. O. Saburov, D. V. Bobrovskiy, V. A. Berlyand, N. M. Sobolevskiy, Yu. E. Titarenko, A. N. Soloviev, A. V. Berlyand, Sergey I. Tyutyunnikov, A. Yu. Titarenko, V. F. Batyaev, E. M. Syresin, A. I. Chumakov, Milan P. Pešić |
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| Jazyk: | angličtina |
| Rok vydání: | 2019 |
| Předmět: |
Physics
Nuclear and High Energy Physics Range (particle radiation) Radiation 010308 nuclear & particles physics business.industry Nuclear engineering Linear energy transfer 7. Clean energy 01 natural sciences Atomic and Molecular Physics and Optics Charged particle Ion Metrology Semiconductor Nanoelectronics 0103 physical sciences Radiology Nuclear Medicine and imaging Irradiation 010306 general physics business |
| Zdroj: | Physics of Particles and Nuclei Letters |
| Popis: | The problems of the metrological certification of beams of high-energy heavy charged particles (HCPs) and protons that will be used in the study—as well as testing for radiation resistance—of promising products of semiconductor micro- and nanoelectronics, solid-state microwave electronics, and micromechanical systems are considered. One of the main requirements for such beams is ensuring the desired range of linear energy transfer (LET). Two methods for changing the LET are considered, one of which is based on using the ions of various types (16O, 22Ne, 40Ar, 56Fe, 84Kr, 136Xe, 209Bi), and the other is based on using ion of the same type (197Au), but with different energies. The advantages of using both methods are considered and the problems arising when using the second method are analyzed. © 2019, Pleiades Publishing, Ltd. |
| Databáze: | OpenAIRE |
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