Andromede project: Surface analysis and modification with probes from hydrogen to nano-particles in the MeV energy range
Autor: | X. Donzel, Elodie Verzeroli, Benoit Agnus, Michael J. Eller, Gabriel Gaubert, Serge Della-Negra, Anne Delobbe, Bernard Rasser, E. Cottereau |
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Přispěvatelé: | Institut de Physique Nucléaire d'Orsay (IPNO), Université Paris-Sud - Paris 11 (UP11)-Institut National de Physique Nucléaire et de Physique des Particules du CNRS (IN2P3)-Centre National de la Recherche Scientifique (CNRS), Orsay Physics (ZAC Saint Charles), PANTECHNIK S.A., Pantechnik |
Jazyk: | angličtina |
Rok vydání: | 2014 |
Předmět: |
010302 applied physics
Nuclear and High Energy Physics Ion beam analysis Ion beam Chemistry Liquid metal ion source [PHYS.NEXP]Physics [physics]/Nuclear Experiment [nucl-ex] Ion gun 7. Clean energy 01 natural sciences Ion source law.invention Secondary ion mass spectrometry Ion beam deposition law 0103 physical sciences Van de Graaff generator Physics::Accelerator Physics Atomic physics 010306 general physics Instrumentation |
Zdroj: | Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms Proceedings of the 19th International Conference on Ion Beam Modification of Materials (IBMM 2014) Proceedings of the 19th International Conference on Ion Beam Modification of Materials (IBMM 2014), Sep 2014, Leuven, Belgium. pp.367-370, ⟨10.1016/j.nimb.2015.07.090⟩ |
DOI: | 10.1016/j.nimb.2015.07.090⟩ |
Popis: | International audience; The Andromede project is the center of a multi-disciplinary team which will build a new instrument for surface modification and analysis using the impact of probes from hydrogen to nano-particles (Au400+4) in the MeV range. For this new instrument a series of atomic, polyatomic, molecular and nano-particle ion beams will be delivered using two ion sources in tandem, a liquid metal ion source and an electron cyclotron resonance source. The delivered ion beams will be accelerated to high energy with a 4 MeV van de Graaff type accelerator. By using a suite of probes in the MeV energy range, ion beam analysis techniques, MeV atomic and cluster secondary ion mass spectrometry can all be performed in one location. A key feature of the instrument is its ability to produce an intense beam for injection into the accelerator. The commissioning of the two sources shows that intense beams from atomic ions to nano-particles can be delivered for subsequent acceleration. The calculations and measurements for the two sources are presented. |
Databáze: | OpenAIRE |
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