Effect of thermal lensing and the micrometric degraded regions on the catastrophic optical damage process of high-power laser diodes
Autor: | Juan Jiménez, J. L. Pura, Jorge Souto |
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Rok vydání: | 2020 |
Předmět: |
Catastrophic optical damage
Materials science business.industry Laser diodes Physics::Optics Cathodoluminescence Hot spot (veterinary medicine) 02 engineering and technology 021001 nanoscience & nanotechnology Laser 01 natural sciences Atomic and Molecular Physics and Optics law.invention 010309 optics Optics law Diodos láser 0103 physical sciences Thermal Laser power scaling 0210 nano-technology business Quantum well Diode |
Zdroj: | UVaDOC. Repositorio Documental de la Universidad de Valladolid instname |
ISSN: | 1539-4794 |
Popis: | Producción Científica Catastrophic optical damage (COD) is one of the processes limiting the lifetime of high-power laser diodes. The understanding of this degradation phenomenon is critical to improve the laser power and lifetime for practical applications. In this Letter, we analyze the defect propagation inside the cavity of quantum well (QW) high-power laser diodes presenting COD. For this, we studied the effect of highly localized thermal gradients and degraded regions on the laser field distribution. Finite element method (FEM) simulations are compared to experimental cathodoluminescence (CL) measurements. The presence of micrometric hot spots inside the QW induces the thermal lensing of the laser field. The laser self-focusing inside the cavity eventually generates a new hot spot, and, in a repetitive way, a sequence of hot spots would be created. This would account for the propagation of the dark line defects (DLDs) that are characteristic of this degradation mode. Junta de Castilla y León (project VA283P18) Ministerio de Economía, Industria y Competitividad (project ENE2014-56069-C4-4-R) Ministerio de Educación, Cultura y Deporte (project FPU14/00916) |
Databáze: | OpenAIRE |
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