The microwave power handling of an FIB-generated weak link in a YBCO film
| Autor: | Lesley F. Cohen, M. W. Denhoff, A. Cowie |
|---|---|
| Rok vydání: | 1999 |
| Předmět: |
Josephson effect
Materials science business.industry Condensed Matter - Superconductivity Metals and Alloys FOS: Physical sciences Condensed Matter Physics Focused ion beam Ion Superconductivity (cond-mat.supr-con) Resonator Electrical resistivity and conductivity Materials Chemistry Ceramics and Composites Optoelectronics Electrical and Electronic Engineering Thin film business Sheet resistance Microwave |
| Zdroj: | Superconductor Science and Technology. 12:431-435 |
| ISSN: | 1361-6668 0953-2048 |
| DOI: | 10.1088/0953-2048/12/7/305 |
| Popis: | We have measured the power dependent microwave properties of a weak link in a YBa2Cu3O7 thin film formed by writing a line of damage using a focused ion beam. The measurement was made using a parallel plate resonator at 5.5 GHz with the weak link written across the width of one of the plates. The ion induced damage was characterized using a TRIM computer simulation and the dc properties of similar weak links was measured. Using a 200 eV Si ion dose of 2e13 cm-2, the Tc of the damaged region was reduced by 5.5 K and the normal resistivity was doubled. Surprisingly, the microwave measurements did not show any Josephson junction characteristics. Rather, the ion damaged region exhibited a greatly increased microwave resistivity that was constant as a function of microwave power up to rf fields of 20 mT at 21 K. Comment: 10 pages (with figures included), 6 figures, LaTeX2e, revised Mar 1999, accepted for publication by: Supercond. Sci. Technol |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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