Compensation of charging in X-PEEM: a successful test on mineral inclusions in 4.4Ga old zircon

Autor:	Gelsomina De Stasio, John W. Valley, B. H. Frazer, Benjamin Gilbert, Katherine L. Richter
Rok vydání:	2003
Předmět:	Analytical chemistry Mineralogy engineering.material Atomic and Molecular Physics and Optics Silicate XANES Electronic Optical and Magnetic Materials chemistry.chemical_compound Chemical species chemistry Coating engineering Cubic zirconia Inclusion (mineral) Instrumentation Quartz Zircon
Zdroj:	Ultramicroscopy. 98:57-62
ISSN:	0304-3991
DOI:	10.1016/s0304-3991(03)00088-3
Popis:	We present a new differential-thickness coating technique to analyze insulating samples with X-ray PhotoElectron Emission spectroMicroscopy (X-PEEM). X-PEEM is non-destructive, analyzes the chemical composition and crystal structure of minerals and can spatially resolve chemical species with a resolution presently reaching 35 nm. We tested the differential coating by analyzing a 4.4 billion-year-old zircon (ZrSiO 4 ) containing silicate inclusions. We observed quartz (SiO 2 ) inclusions smaller than 1 μm in size that can only be analyzed non-destructively with synchrotron spectromicroscopies. With the removal of charging we greatly extend the range of samples that can be analyzed by X-PEEM.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_dedup___::61f2129da318607d7ce4bf2442584ff8 https://doi.org/10.1016/s0304-3991(03)00088-3 Zobrazit plný text záznamu Full Text from ScienceDirect