In situbending of an Au nanowire monitored by micro Laue diffraction

Autor: Gunther Richter, Cédric Leclere, Olivier P. Thomas, Laurent Belliard, Thomas W. Cornelius, Anton Davydok, Zhe Ren, Odile Robach, Jean-Sébastien Micha
Přispěvatelé: Institut des Matériaux, de Microélectronique et des Nanosciences de Provence (IM2NP), Aix Marseille Université (AMU)-Université de Toulon (UTLN)-Centre National de la Recherche Scientifique (CNRS), Structures et propriétés d'architectures moléculaire (SPRAM - UMR 5819), Institut Nanosciences et Cryogénie (INAC), Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Université Grenoble Alpes [2016-2019] (UGA [2016-2019])-Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Université Grenoble Alpes [2016-2019] (UGA [2016-2019])-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS), Max-Planck-Institut für Intelligente Systeme, Max-Planck-Gesellschaft, Institut des Nanosciences de Paris (INSP), Université Pierre et Marie Curie - Paris 6 (UPMC)-Centre National de la Recherche Scientifique (CNRS), French National Research Agency [ANR-11-BS10-01401 MecaNIX], Université de Toulon (UTLN)-Centre National de la Recherche Scientifique (CNRS)-Aix Marseille Université (AMU), Université Grenoble Alpes [2016-2019] (UGA [2016-2019])-Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Université Grenoble Alpes [2016-2019] (UGA [2016-2019])-Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS)
Rok vydání: 2015
Předmět:
Zdroj: Journal of Applied Crystallography
Journal of Applied Crystallography, 2015, 48 (1), pp.291-296. ⟨10.1107/S1600576715001107⟩
'Journal of Applied Crystallography ', vol: 48, pages: 291-296 (2015)
Journal of Applied Crystallography, International Union of Crystallography, 2015, 48 (1), pp.291-296. ⟨10.1107/S1600576715001107⟩
ISSN: 1600-5767
0021-8898
DOI: 10.1107/s1600576715001107
Popis: The in situ three-point bending of a single self-suspended Au nanowire is visualized by micro Laue diffraction. The nanowire deflection is inferred from the displacement of Laue spots and it is well described by finite element analysis taking into account geometric nonlinearities and the elastic constants of bulk Au.
This article1 reports on the first successful combination of micro Laue (µLaue) diffraction with an atomic force microscope for in situ nanomechanical tests of individual nanostructures. In situ three-point bending on self-suspended gold nanowires was performed on the BM32 beamline at the ESRF using a specially designed atomic force microscope. During the bending process of the self-suspended wire, the evolution of µLaue diffraction patterns was monitored, allowing for extraction of the bending angle of the nanowire. This bending compares well with finite element analysis taking into account elastic constant bulk values and geometric nonlinearities. This novel experimental setup opens promising perspectives for studying mechanical properties at the nanoscale.
Databáze: OpenAIRE