Perspectives of development of X-ray analysis for material composition
| Autor: | Mikhailov, I.F., Baturin, A.A., Mikhailov, A.I., Fomina, L.P. |
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| Rok vydání: | 2016 |
| Předmět: |
010302 applied physics
Materials science 0103 physical sciences Analytical chemistry Physics::Accelerator Physics General Materials Science Characterization and properties 02 engineering and technology Composition (combinatorics) 021001 nanoscience & nanotechnology 0210 nano-technology X ray analysis 01 natural sciences |
| Zdroj: | Functional materials. 23:5-14 |
| ISSN: | 2218-2993 1027-5495 |
| Popis: | Perspectives are considered for increasing the sensitivity of X-ray analysis and broadening the range of measurements toward chemical elements with small atomic numbers up to hydrogen at the expense of formation of the optimized selective spectrum from a preliminary beam for exciting fluorescence and observing scattering peaks and diffraction reflections. It has been shown that low-power preliminary sources (X-ray tube, 20 W) are able to provide the detection limit for trace impurities near 0.1 ppm, and for hydrogen in metals - up to 10 ppm. The data presented are hopeful for attaining X-ray analysis sensitivity at the level of ppb units due to application of powerful preliminary beams (synchrotron, undulators, wigglers, etc.). |
| Databáze: | OpenAIRE |
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