Copper Oxide Precipitates in NBS Standard Reference Material 482
| Autor: | Robert A. Carlton, Scott A. Wight, David S. Bright, Greg Gillen, Eric S. Windsor |
|---|---|
| Jazyk: | angličtina |
| Rok vydání: | 2002 |
| Předmět: |
Copper oxide
Materials science sample preparation copper-gold alloy Alloy General Engineering Analytical chemistry Oxide chemistry.chemical_element electron probe microanalysis Electron microprobe secondary ion mass spectrometry engineering.material Copper Microanalysis NBS Standard Reference Material 482 Article Secondary ion mass spectrometry metallography chemistry.chemical_compound chemistry oxide inclusions engineering Metallography |
| Zdroj: | Journal of Research of the National Institute of Standards and Technology |
| ISSN: | 2165-7254 1044-677X |
| Popis: | Copper oxide has been detected in the copper containing alloys of NBS Standard Reference Material (SRM) 482. This occurrence is significant because it represents heterogeneity within a standard reference material that was certified to be homogeneous on a micrometer scale. Oxide occurs as elliptically to spherically shaped precipitates whose size differs with alloy composition. The largest precipitates occur in the Au20-Cu80 alloy and range in size from submicrometer up to 2 μm in diameter. Precipitates are observed using light microscopy, electron microscopy, and secondary ion mass spectrometry (SIMS). SIMS has demonstrated that the precipitates are present within all the SRM 482 wires that contain copper. Only the pure gold wire is precipitate free. Initial results from the analysis of the Au20-Cu80 alloy indicate that the percentage of precipitates is less than 1 % by area. Electron probe microanalysis (EPMA) of large (2 μm) precipitates in this same alloy indicates that precipitates are detectable by EPMA and that their composition differs significantly from the certified alloy composition. The small size and low percentage of these oxide precipitates minimizes the impact that they have upon the intended use of this standard for electron probe microanalysis. Heterogeneity caused by these oxide precipitates may however preclude the use of this standard for automated EPMA analyses and other microanalysis techniques. |
| Databáze: | OpenAIRE |
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