| Autor: |
Joost W. M. Frenken, R.M. Uiterlinden, J. Vrijmoeth, A.M. Molenbroek, G. J. Ruwiel, P. M. Zagwijn, J. Ter Beek, J. ter Horst |
| Jazyk: |
angličtina |
| Rok vydání: |
1994 |
| Předmět: |
|
| Zdroj: |
Nuclear Inst. and Methods in Physics Research, B, 94(1-2), 137-149. ELSEVIER SCIENCE BV |
| ISSN: |
0168-583X |
| Popis: |
We have designed and built a two-dimensional position sensitive ion detector for use in combination with a toroidal electrostatic analyser. The detector is part of a medium-energy ion scattering set-up, which we exploit to determine the atomic structure and composition of surfaces and interfaces. The ion position is resolved in the angular and energy dispersive directions of the analyser by means of microchannel plates and a charge-dividing collector. The analyser/detector combination has an acceptance in the angular direction of 20° and in the backscatter energy direction of 2.0% of the central pass energy. The detection system has an angular resolution of 0.10° and a relative energy resolution of l0 × l0-3(FWHM). All detection events are processed individually by a transputer system controlling a VME-bus interface and capable of handling a periodic count rate of 65 kHz. A Silicon Graphics workstation serves as a user-interface. |
| Databáze: |
OpenAIRE |
| Externí odkaz: |
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