Correlation between magnetoresistive properties and growth morphology of La1−xMnO3−δ thin films deposited on SrTiO3, LaAlO3 and MgO
Autor: | J.P. Sénateur, K. Yu-Zhang, K. Han, H. Vincent, Yamin Leprince-Wang, S. Pignard |
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Přispěvatelé: | Laboratoire de Physique des Matériaux Divisés et des Interfaces (LPMDI), Université Paris-Est Marne-la-Vallée (UPEM), Laboratoire des matériaux et du génie physique (LMGP ), Institut National Polytechnique de Grenoble (INPG)-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP )-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS), Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP )-Institut National Polytechnique de Grenoble (INPG)-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS) |
Rok vydání: | 2001 |
Předmět: |
010302 applied physics
Materials science Colossal magnetoresistance Magnetoresistance Scanning electron microscope Metals and Alloys Analytical chemistry Mineralogy 02 engineering and technology Surfaces and Interfaces 021001 nanoscience & nanotechnology Epitaxy 01 natural sciences Surfaces Coatings and Films Electronic Optical and Magnetic Materials Transmission electron microscopy 0103 physical sciences Materials Chemistry Metalorganic vapour phase epitaxy Thin film 0210 nano-technology High-resolution transmission electron microscopy |
Zdroj: | Thin Solid Films Thin Solid Films, Elsevier, 2001, 391 (1), pp.21--27. ⟨10.1016/S0040-6090(01)00970-1⟩ |
ISSN: | 0040-6090 |
DOI: | 10.1016/s0040-6090(01)00970-1 |
Popis: | International audience; A new metal-organic chemical vapour deposition (MOCVD) technique was used for fabrication of epitaxial La-manganite thin films La1-xMnO3-delta with both lanthanum and oxygen deficiencies. Three kinds of substrates, i.e. SrTiO3 (001), LaAlO3 (012) and MgO (001), were chosen for comparison. Electrical and magnetic property measurements revealed that the amplitude of the colossal magnetoresistance (CMR) is dependent on the nature of the substrate whereas the electrical and magnetic transition temperatures are not sensitive to the substrate type. In order to correlate the physical properties of the films to their crystallization quality and their growth morphology, scanning electron microscopy (SEM), transmission electron microscopy (TEM), as well as high-resolution transmission elect:ron microscopy (HRTEM), were employed. Cross-sectional TEM investigations showed that the La1-xMnO3-delta is generally in good epitaxy with all three kinds of substrate. The orientation relationships between the film and substrate are rather well defined at the vicinity of the interface but not at the surface of the film. Deposition of La1-xMnO3-delta on SrTiO3 produces the best interfacial match since these two have the least lattice misfit. This is consistent with the best magnetoresistive property measured for the investigated systems. (C) 2001 Elsevier Science B.V. All rights reserved. |
Databáze: | OpenAIRE |
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