Laser induced deflection technique for absolute thin film absorption measurement: optimized concepts and experimental results
| Autor: | Christian Mühlig, Uwe Speck, Siegfried Kufert, Simon Bublitz |
|---|---|
| Rok vydání: | 2011 |
| Předmět: |
Materials science
business.industry Materials Science (miscellaneous) engineering.material medicine.disease_cause Laser Industrial and Manufacturing Engineering law.invention Surface coating Wavelength Optical coating Optics Coating law Deflection (engineering) medicine engineering Optoelectronics Business and International Management Thin film business Ultraviolet |
| Zdroj: | Applied Optics. 50:C449 |
| ISSN: | 1539-4522 0003-6935 |
| DOI: | 10.1364/ao.50.00c449 |
| Popis: | Using experimental results and numerical simulations, two measuring concepts of the laser induced deflection (LID) technique are introduced and optimized for absolute thin film absorption measurements from deep ultraviolet to IR wavelengths. For transparent optical coatings, a particular probe beam deflection direction allows the absorption measurement with virtually no influence of the substrate absorption, yielding improved accuracy compared to the common techniques of separating bulk and coating absorption. For high-reflection coatings, where substrate absorption contributions are negligible, a different probe beam deflection is chosen to achieve a better signal-to-noise ratio. Various experimental results for the two different measurement concepts are presented. |
| Databáze: | OpenAIRE |
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