Advances in MEMS switches for RF test applications
| Autor: | Chris Keimel, Tamir E. Moran, Todd Frederick Miller |
|---|---|
| Rok vydání: | 2016 |
| Předmět: |
Microelectromechanical systems
Engineering business.industry Electrical engineering 020206 networking & telecommunications 02 engineering and technology 021001 nanoscience & nanotechnology Power (physics) Automatic test equipment Broadband 0202 electrical engineering electronic engineering information engineering Electronic engineering Power handling 0210 nano-technology business |
| Zdroj: | 2016 46th European Microwave Conference (EuMC). |
| Popis: | This paper details the broadband RF switching challenges in Test and Measurement (T&M) and Automated Test Equipment (ATE) applications, including the need for high performance RF switches capable of 25W. The design, validation and manufacturing of ohmic RF MEMS switches are presented as suitable replacements for electromechanical (EM) switches in T&M and ATE applications. The switches are capable of supporting DC to RF frequencies, reliably hot switching at least 30 dBm of power for millions of cycles, handle as much as 25W of power under cold switching conditions, and are available in standard surface mount (SMT) packages that make them easy to use with low cost, traditional processes. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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