X-Ray Tomography for the ATLAS Semi-Conductor Tracker

Autor:	L Vertogradov, Richard Nickerson, G. Doucas, Joern Grosse-Knetter
Jazyk:	angličtina
Rok vydání:	1998
Předmět:	Physics Nuclear and High Energy Physics Large Hadron Collider Silicon business.industry Atlas (topology) X-ray chemistry.chemical_element Repeatability Semiconductor Optics chemistry Tomography Polar coordinate system Detectors and Experimental Techniques business Instrumentation
Popis:	Results are presented of precision tests with the prototype of an X-ray tomography system for measuring the two-dimensional position of silicon strip modules on barrel structures. The measured accuracy and repeatability are better than 6 μm in rφ and better than 30 μm in r , where r and φ are polar coordinates, and are sufficient for a high-precision survey of the barrels of the ATLAS semi-conductor tracker.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_dedup___::5e6f934a3f5b4c268f36f692a56bf299 http://cds.cern.ch/record/683710 Zobrazit plný text záznamu