Optical wave propagation in epitaxial Nd:Y2O3 planar waveguides
| Autor: | Thomas Tiedje, Wei Li, Raveen Kumaran, Shawn Penson, Scott E. Webster |
|---|---|
| Rok vydání: | 2010 |
| Předmět: |
Materials science
Wave propagation business.industry Materials Science (miscellaneous) Cladding (fiber optics) Industrial and Manufacturing Engineering law.invention Root mean square Optics Prism coupler law Dispersion relation Surface roughness Optoelectronics Business and International Management business Waveguide Refractive index |
| Zdroj: | Applied optics. 49(4) |
| ISSN: | 1539-4522 0306-8919 |
| Popis: | Optical wave propagation in neodymium-doped yttrium oxide (Nd:Y2O3) films grown on R-plane sapphire substrates by molecular beam epitaxy has been studied by the prism coupler method. The measurements yield propagation loss data, the refractive index, and the dispersion relation. The refractive index of the Nd:Y2O3 at 632.8 nm is found to be 1.909, and the lowest propagation loss measured is 0.9 ± 0.2 cm−1 at 1046 nm with a polymethyl methacrylate top cladding layer on a film with 6 nm root mean square surface roughness. The loss measurements suggest that the majority loss of this planar waveguide sample is scatter from surface roughness that can be described by the model of Payne and Lacey [Opt. Quantum Electron.26, 977 (1994)]. OQELDI0306-891910.1007/BF00708339 |
| Databáze: | OpenAIRE |
| Externí odkaz: |
|
Full text from SpringerLink