Electrical and optical characterization of nanostructures
| Autor: | V. Rosskopf, Jürgen Smoliner, Erich Gornik |
|---|---|
| Rok vydání: | 1994 |
| Předmět: |
Nanostructure
Materials science business.industry General Physics and Astronomy Nanotechnology Semiconductor device Condensed Matter::Mesoscopic Systems and Quantum Hall Effect Condensed Matter Physics Photo conductivity Atomic and Molecular Physics and Optics Surfaces Coatings and Films Electronic Optical and Magnetic Materials Characterization (materials science) Quantum size Transmission (telecommunications) Far infrared Optoelectronics Electrical and Electronic Engineering business Quantum tunnelling |
| Zdroj: | Microelectronic Engineering. 24:305-315 |
| ISSN: | 0167-9317 |
| DOI: | 10.1016/0167-9317(94)90083-3 |
| Popis: | The characterization of nanostructures is a topic of vital interest, since the dimensions of commercially available semiconductor devices are now in a range, where quantum size effects become evident. In this paper, various methods are presented to characterize low-dimensional structures. Magnetic depopulation, tunneling, Far Infrared transmission, photo conductivity and magnetophonon resonances are used to determine the low-dimensional subband energies. For each method, the special features are discussed and it is demonstrated, that the differnt methods yield different, complementary information. |
| Databáze: | OpenAIRE |
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