High-energy resolution PIXE study of heat induced changes in cadmium compounds using ion microbeam

Autor:	Y. Mokuno, Yuji Horino, Tonči Tadić, R Trojko, I.D Desnica, Milko Jakšić
Rok vydání:	1999
Předmět:	Nuclear and High Energy Physics Cadmium Resolution (mass spectrometry) Spectrometer Chemistry Radiochemistry Analytical chemistry chemistry.chemical_element Phosphor Microanalysis Cadmium telluride photovoltaics Crystal Chemical state Instrumentation
Zdroj:	Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms. 158:241-244
ISSN:	0168-583X
DOI:	10.1016/s0168-583x(99)00320-1
Popis:	The intensity changes of the satellite X-ray line spectra can be related to the changes in the chemical environment of atoms in the sample. High-energy resolution PIXE analysis of chemical effects in X-ray spectra of Cd L lines was applied in studies of heat-treated CdS and CdTe cadmium compounds. The applicability of the method for monitoring crystal phases and chemical states in these and other materials using ion microbeam with high energy resolution PIXE spectrometer is discussed.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_dedup___::5c122bee788c7c608c7a85ba739d3417 https://doi.org/10.1016/s0168-583x(99)00320-1 Zobrazit plný text záznamu Full Text from ScienceDirect