Mobility and Stability Enhancement of Amorphous In-Ga-Zn-O TFTs With Atomic Layer Deposited Al2O3/SiO2Stacked Insulators
| Autor: | Shi-Jin Ding, Shi-Bing Qian, Wen-Jun Liu, Li-Li Zheng, You-Hang Wang |
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| Rok vydání: | 2016 |
| Předmět: |
Materials science
Analytical chemistry Electrical stability thin-film transistor Insulator (electricity) 02 engineering and technology Dielectric 01 natural sciences negative gate bias stress 0103 physical sciences Amorphous In-Ga-Zn-O Thermal stability Electrical and Electronic Engineering 010302 applied physics business.industry Electrical engineering SiO2 buffer layer 021001 nanoscience & nanotechnology Electronic Optical and Magnetic Materials Amorphous solid Threshold voltage Thin-film transistor Subthreshold swing lcsh:Electrical engineering. Electronics. Nuclear engineering 0210 nano-technology business lcsh:TK1-9971 Biotechnology |
| Zdroj: | IEEE Journal of the Electron Devices Society, Vol 4, Iss 5, Pp 347-352 (2016) |
| ISSN: | 2168-6734 |
| DOI: | 10.1109/jeds.2016.2574844 |
| Popis: | Amorphous In-Ga-Zn-O (a-IGZO) thin film transistors (TFTs) were fabricated with an atomic-layer-deposited (ALD) SiO2 buffer layer between the a-IGZO channel and the Al2O3 dielectric. Compared with the TFTs with a single Al2O3 dielectric, the a-IGZO TFTs with the Al2O3/SiO2 stacked insulator demonstrated improved performance. That is, the field-effect mobility increased from 12.3 to 16.2 cm2V-1s-1, the threshold voltage (Vth) and subthreshold swing (SS) decreased from 1.14 to 0.72 V and from 0.48 to 0.30 V/dec, respectively. Furthermore, the Al2O3/SiO2 device also exhibited better electrical stability under negative gate bias stress and negative bias illumination stress than the Al2O3 device. These are mainly attributed to improved interfacial properties between IGZO and SiO2. Such a buffer layer of ALD SiO2 in a-IGZO TFTs is very promising for practical applications. |
| Databáze: | OpenAIRE |
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