Simultaneous ambient pressure x-ray photoelectron spectroscopy and grazing incidence x-ray scattering in gas environments
| Autor: | Heath Kersell, Henrique P. Martins, Sujoy Roy, Felix Brausse, Monika Blum, Bo-Hong Liu, Qiyang Lu, Hendrik Bluhm, Bruce Rude, Pengyuan Chen, A. L. D. Kilcoyne, Slavomír Nemšák |
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| Rok vydání: | 2021 |
| Předmět: |
Diffraction
Materials science Physics - Instrumentation and Detectors physics.chem-ph FOS: Physical sciences Mass spectrometry 01 natural sciences 010305 fluids & plasmas law.invention Optics Engineering X-ray photoelectron spectroscopy law Physics - Chemical Physics 0103 physical sciences Instrumentation physics.ins-det Applied Physics 010302 applied physics Chemical Physics (physics.chem-ph) business.industry Scattering X-ray Instrumentation and Detectors (physics.ins-det) Synchrotron Chemical state Physical Sciences Chemical Sciences business Ambient pressure |
| Zdroj: | The Review of scientific instruments, vol 92, iss 4 Review of Scientific Instruments |
| ISSN: | 1089-7623 |
| Popis: | We have developed an experimental system to simultaneously observe surface structure, morphology, composition, chemical state, and chemical activity for samples in gas phase environments. This is accomplished by simultaneously measuring X-ray photoelectron spectroscopy (XPS) and grazing incidence X-ray scattering (GIXS) in gas pressures as high as the multi-Torr regime, while also recording mass spectrometry. Scattering patterns reflect near-surface sample structures from the nano- to the meso-scale. The grazing incidence geometry provides tunable depth sensitivity while scattered X-rays are detected across a broad range of angles using a newly designed pivoting-UHV-manipulator for detector positioning. At the same time, XPS and mass spectrometry can be measured, all from the same sample spot and in ambient conditions. To demonstrate the capabilities of this system, we measured the chemical state, composition, and structure of Ag-behenate on a Si(001) wafer in vacuum and in O$_2$ atmosphere at various temperatures. These simultaneous structural, chemical, and gas phase product probes enable detailed insights into the interplay between structure and chemical state for samples in gas phase environments. The compact size of our pivoting-UHV-manipulator makes it possible to retrofit this technique into existing spectroscopic instruments installed at synchrotron beamlines. Because many synchrotron facilities are planning or undergoing upgrades to diffraction limited storage rings with transversely coherent beams, a newly emerging set of coherent X-ray scattering experiments can greatly benefit from the concepts we present here. 21 pages, 4 figures |
| Databáze: | OpenAIRE |
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