A look-up table based approach to characterize crystal twinning for synchrotron X-ray Laue microdiffraction scans
Autor: | Yao Li, Liang Wan, Kai Chen |
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Jazyk: | angličtina |
Rok vydání: | 2015 |
Předmět: |
Materials science
business.industry Astrophysics::High Energy Astrophysical Phenomena Crystal system X-ray look-up tables Mineralogy twinning computer.file_format Research Papers General Biochemistry Genetics and Molecular Biology Synchrotron law.invention Optics law Lattice (order) Condensed Matter::Superconductivity crystal orientation maps Lookup table Molecular symmetry Raster graphics business Crystal twinning computer synchrotron X-ray Laue microdiffraction |
Zdroj: | Journal of Applied Crystallography |
ISSN: | 1600-5767 0021-8898 |
Popis: | An automated method has been developed to characterize the type and spatial distribution of twinning in crystal orientation maps from synchrotron X-ray Laue microdiffraction results. An automated method has been developed to characterize the type and spatial distribution of twinning in crystal orientation maps from synchrotron X-ray Laue microdiffraction results. The method relies on a look-up table approach. Taking into account the twin axis and twin plane for plausible rotation and reflection twins, respectively, and the point group symmetry operations for a specific crystal, a look-up table listing crystal-specific rotation angle–axis pairs, which reveal the orientation relationship between the twin and the parent lattice, is generated. By comparing these theoretical twin–parent orientation relationships in the look-up table with the measured misorientations, twin boundaries are mapped automatically from Laue microdiffraction raster scans with thousands of data points. Taking advantage of the high orientation resolution of the Laue microdiffraction method, this automated approach is also applicable to differentiating twinning elements among multiple twinning modes in any crystal system. |
Databáze: | OpenAIRE |
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