Experimental Investigations on the Tuning of Active Gate Drivers under Load Current Variations
Autor: | Franco Fiori, Erica Raviola |
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Přispěvatelé: | Pinker, Jiří |
Rok vydání: | 2021 |
Předmět: |
Computer science
přepínání průběhů AGD tuning Active Gate Driver (AGD) Power transistors Switching waveforms výkonové tranzistory Power (physics) Reduction (complexity) AGD ovladač aktivní brány Logic gate Hardware_INTEGRATEDCIRCUITS Electronic engineering switching waveforms Waveform Power semiconductor device Current (fluid) ladění AGD Active Gate Driver Gate current power transistors Voltage |
Zdroj: | 2021 International Conference on Applied Electronics (AE). |
DOI: | 10.23919/ae51540.2021.9542894 |
Popis: | the Power Electronics Innovation Center (PEIC), Politecnico di Torino,Italy Active Gate Drivers have gained of interest asthey allow one to shape the switching waveforms finely,thus reducing overshoots and oscillations. However, whenfast power switches are exploited, the tuning of such driversis still challenging. This paper investigates the adjustmentof gate current profile under load variations, which is acrucial issue when targeting practical applications. Indeed,a technique, based on the stretching of time intervals,is proposed and its effectiveness, in terms of undershootreduction, is experimentally assessed.Keywords—Active Gate Driver (AGD), switching wave-forms, AGD tuning, power transistors. |
Databáze: | OpenAIRE |
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