Microcrystalline and micromorph device improvements through combined plasma and material characterization techniques

Autor: Gaetano Parascandolo, Benjamin Strahm, Andrea Feltrin, A. C. Bronneberg, R. Bartlome, Grégory Bugnon, Christophe Ballif
Přispěvatelé: Plasma & Materials Processing
Rok vydání: 2011
Předmět:
Zdroj: Solar Energy Materials and Solar Cells, 95(1), 134-137. Elsevier
ISSN: 0927-0248
Popis: Hydrogenated microcrystalline silicon (µc-Si:H) growth by very high frequency plasma-enhanced chemical vapor deposition (VHF-PECVD) is studied in an industrial-type parallel plate KAI reactor. Combined plasma and material characterization techniques allow to assess critical deposition parameters for the fabrication of high quality material. A relation between low intrinsic stress of the deposited i-layer and better performing solar cell devices is identified. Significant solar cell device improvements were achieved based on these findings: high open circuit voltages above 520 mV and fill factors above 74% were obtained for 1 µm thick µc-Si:H single junction cells and a 1.2 cm2 micromorph device with 12.3% initial (Voc=1.33 V, FF=72.4%, Jsc=12.8 mA cm-2) and above 10.0% stabilized efficiencies.
Databáze: OpenAIRE