Morphology and fluorescence quenching in photovoltaic samples containing fullerene and poly(p-phenylene-vinylene) derivatives
| Autor: | Roder, T, Kitzerow, HS, Hummelen, JC, Röder, T. |
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| Přispěvatelé: | Rijksuniversiteit Groningen, University of Groningen, Chemistry of (Bio)organic Materials and Devices, Stratingh Institute of Chemistry |
| Jazyk: | Dutch; Flemish |
| Rok vydání: | 2004 |
| Předmět: |
PLASTIC SOLAR-CELLS
BUCKMINSTERFULLERENE Fullerene Morphology (linguistics) Materials science EFFICIENCY Analytical chemistry fluorescence quenching HETEROJUNCTIONS bulk heterojunction solar cells law.invention chemistry.chemical_compound Buckminsterfullerene Optical microscope law Materials Chemistry COMPOSITES Quenching (fluorescence) atomic force microscopy Mechanical Engineering Metals and Alloys PHOTODIODES Poly(p-phenylene vinylene) Condensed Matter Physics Fluorescence near-field scanning optical microscopy Electronic Optical and Magnetic Materials NETWORKS photovoltaics CONVERSION chemistry Mechanics of Materials Near-field scanning optical microscope FIELD OPTICAL MICROSCOPY |
| Zdroj: | Synthetic Metals, 141(3), 271-275. Elsevier Science |
| ISSN: | 0379-6779 |
| Popis: | We have studied the morphology of different heterogeneous samples containing poly [2-methoxy,5-(3',7'-dimethyl-octyloxy)]-p-phenylene-vinylene (MDMO-PPV) and either fullerene (C(60)) or 6,6-phenyl C(61)-butyric acid methyl ester (PCBM) using atomic force microscopy in the shear force detection mode or pulsed-force mode and near-field scanning optical microscopy. These investigations confirm the large influence of preparation conditions on the morphology. Systematic variation of the layer thicknesses in two-layer samples indicate that fluoresecence quenching is restricted to ail interface layer with a thickness of about 40 nm. (C) 2003 Published by Elsevier B.V. |
| Databáze: | OpenAIRE |
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