Nanometer-precise optical length measurement using near-field scanning optical microscopy with sharpened single carbon nanotube probe
| Autor: | Ichiro Yamakawa, Kaifeng Zhang, Takehiro Tachizaki, Taniguchi Shinichi, Toshihiko Nakata |
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| Rok vydání: | 2018 |
| Předmět: |
010302 applied physics
Microscope Materials science business.industry Physics::Optics 02 engineering and technology Carbon nanotube 021001 nanoscience & nanotechnology 01 natural sciences Atomic and Molecular Physics and Optics Electronic Optical and Magnetic Materials law.invention Length measurement Optical microscope law 0103 physical sciences Optoelectronics Statistical analysis Near-field scanning optical microscope Nanometre 0210 nano-technology business Instrumentation Refractive index |
| Zdroj: | Ultramicroscopy. 186:18-22 |
| ISSN: | 0304-3991 |
| DOI: | 10.1016/j.ultramic.2017.12.006 |
| Popis: | We have developed and characterized a plasmon-excitation scattering-type near-field scanning optical microscope with sharpened single carbon nanotube probe. The developed microscope can optically capture differences in the refractive index of single-nanometer surface structures. Statistical analysis enabled us to estimate the precision of the optical length measurement to 1.8 nm. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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