In-Situ Monitoring of the Internal Stress Evolution during Thin Film Anodising

Autor:	Joris Proost, Jean-François Vanhumbeeck, Quentin Van Overmeere
Rok vydání:	2008
Předmět:	In situ Engineering business.industry Anodizing Metallurgy Forensic engineering Thin film business Internal stress
Zdroj:	ECS Transactions. 11:35-42
ISSN:	1938-6737 1938-5862
DOI:	10.1149/1.2909723
Popis:	Transitions in the internal stress evolution have systematically been observed during both galvanostatic and potentiostatic staircase anodising of Ti thin films. They have been attributed to, respectively, oxygen evolution and mechanical breakdown. A simple scaling model is presented to rationalize the effect of oxygen evolution on the internal stress by taking into account the effective growth efficiency.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_dedup___::573554776fc8e9cbcfceb6827b379f77 https://doi.org/10.1149/1.2909723 Zobrazit plný text záznamu