Dispersion engineered silicon nitride waveguides by geometrical and refractive-index optimization
| Autor: | Marco Lisker, J.M. Chavez Boggio, Roger Haynes, D. Bodenmüller, Markus Roth, Lars Zimmermann, René Eisermann, T. Fremberg, Michael Böhm |
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| Rok vydání: | 2014 |
| Předmět: |
Materials science
business.industry Physics::Optics FOS: Physical sciences Statistical and Nonlinear Physics Atomic and Molecular Physics and Optics Supercontinuum law.invention chemistry.chemical_compound Wavelength Optics Silicon nitride chemistry law Dispersion (optics) Refractive index contrast Institut für Chemie business Refractive index Waveguide Physics - Optics Photonic-crystal fiber Optics (physics.optics) |
| DOI: | 10.48550/arxiv.1409.7810 |
| Popis: | Dispersion engineering in silicon nitride (SiX NY ) waveguides is investigated through the optimization of the waveguide transversal dimensions and refractive indices in a multi-cladding arrangement. Ultra-flat dispersion of -84.0 +/- 0.5 ps/nm/km between 1700 and 2440 nm and 1.5 +/- 3 ps/nm/km between 1670 and 2500 nm is numerically demonstrated. It is shown that typical refractive index fluctuations as well as dimension fluctuations during the fabrication of the SiX NY waveguides are a limitation for obtaining ultra-flat dispersion profiles. Single- and multi-cladding waveguides are fabricated and their dispersion profiles measured (over nearly 1000 nm) using a low-coherence frequency domain interferometric technique. By appropriate thickness optimization, the zero-dispersion wavelength is tuned over a large spectral range in both single-cladding waveguides and multi-cladding waveguides with small refractive index contrast (3 %). A flat dispersion profile with 3.2 ps/nm/km variation over 500 nm is obtained in a multi-cladding waveguide fabricated with a refractive index contrast of 37 %. Finally, we generate a nearly three-octave supercontinuum in this dispersion flattened multi-cladding SiX NY waveguide. |
| Databáze: | OpenAIRE |
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