Evaluation of depth of dislocation visibility in SEM electron channeling contrast imaging in Ti-6Al-4V alloy using serial sectioning method
| Autor: | Hideharu Nakashima, Keiji Kubushiro, Shigeto Yamasaki, Misaki Deguchi, Masatoshi Mitsuhara, Yutaro Ota |
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| Rok vydání: | 2020 |
| Předmět: |
010302 applied physics
Materials science Scanning electron microscope business.industry Visibility (geometry) Alloy Titanium alloy 02 engineering and technology Electron engineering.material 021001 nanoscience & nanotechnology 01 natural sciences Optics Structural Biology Extinction (optical mineralogy) 0103 physical sciences engineering Radiology Nuclear Medicine and imaging Dislocation 0210 nano-technology business Instrumentation Electron backscatter diffraction |
| Zdroj: | Microscopy. 70:265-277 |
| ISSN: | 2050-5701 2050-5698 |
| Popis: | In this study, we conducted a quantitative evaluation of dislocation density by scanning electron microscopy electron channeling contrast imaging for α grains of a Ti-6Al-4V alloy deformed at room temperature. The depth of visibility of dislocations is experimentally measured as 140 to 160 nm by a serial sectioning observation. This result is compared with the theoretical value and applied to evaluate dislocation density. These factors confirm that the theoretically calculated value of the depth of visibility, at 5 to 6 times the extinction distance, is valid for the hexagonal close-packed Ti alloy. |
| Databáze: | OpenAIRE |
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